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SPIE Proceedings [SPIE Aerospace/Defense Sensing, Simulation, and Controls - Orlando, FL (Monday 16 April 2001)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI - Nonuniformity correction using a flood technique and 1:1 mapping
Olson, Eric M., Bergin, Thomas P., Murrer, Jr., Robert LeeVolume:
4366
Year:
2001
Language:
english
DOI:
10.1117/12.438099
File:
PDF, 176 KB
english, 2001