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High-accuracy particle sizing by interferometric particle imaging
Qieni, Lü, Wenhua, Jin, Tong, Lü, Xiang, Wang, Yimo, ZhangVolume:
312
Language:
english
Journal:
Optics Communications
DOI:
10.1016/j.optcom.2013.09.049
Date:
February, 2014
File:
PDF, 4.02 MB
english, 2014