Effect of surface recombination and injection level on the...

Semiconductor Science and Technology 1992 / 07 Vol. 7; Iss. 7

Effect of surface recombination and injection level on the diffusion length obtained by simulation of the SPV method

Zhang, Xiumiao, He, Guogen, Song, Jiatao
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Volume:
7
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/7/7/003
Date:
July, 1992
File:
PDF, 237 KB
english, 1992
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