Thermal Stability Study of BaAl 2 Si 2 O 8 :Eu 2+ Phosphor Using Its Polymorphism for Plasma Display Panel Application
Im, Won Bin, Kim, Yong-Il, Jeon, Duk YoungVolume:
18
Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm051894v
Date:
March, 2006
File:
PDF, 299 KB
english, 2006