SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm
Arai, Y., Kikukawa, M., Yokozeki, S., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870461
File:
PDF, 1.02 MB
english, 2010