Accurate quantification of Cu(In,Ga)Se2 films by AES depth profiling analysis
Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Chae, Hong-Chol, Chung, Yong-Duck, Kim, Kyung JoongVolume:
282
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.06.052
Date:
October, 2013
File:
PDF, 1.14 MB
english, 2013