An ensemble model for predicting the remaining useful...

Microelectronics Reliability 2013 / 6 Vol. 53; Iss. 6

An ensemble model for predicting the remaining useful performance of lithium-ion batteries

Xing, Yinjiao, Ma, Eden W.M., Tsui, Kwok-Leung, Pecht, Michael
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.12.003
Date:
June, 2013
File:
PDF, 830 KB
english, 2013
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