Open loop Kelvin probe force microscopy with single and...

Nanotechnology 2013 / 11 Vol. 24; Iss. 47

Open loop Kelvin probe force microscopy with single and multi-frequency excitation

Collins, L, Kilpatrick, J I, Weber, S A L, Tselev, A, Vlassiouk, I V, Ivanov, I N, Jesse, S, Kalinin, S V, Rodriguez, B J
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Volume:
24
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/24/47/475702
Date:
November, 2013
File:
PDF, 1.01 MB
english, 2013
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