[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Packet-based input test data compression techniques
Volkerink, E.H., Khoche, A., Mitra, S.Year:
2002
Language:
english
DOI:
10.1109/TEST.2002.1041756
File:
PDF, 672 KB
english, 2002