Directional Sensitivity of Single Event Upsets in 90 nm...

IEEE Transactions on Nuclear Science 2007 / 12 Vol. 54; Iss. 6

Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

Amusan, Oluwole A., Massengill, Lloyd W., Baze, Mark P., Bhuva, Bharat L., Witulski, Arthur F., DasGupta, Sandeepan, Sternberg, Andrew L., Fleming, Patrick R., Heath, Christopher C., Alles, Michael L.
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2007.907989
Date:
December, 2007
File:
PDF, 642 KB
english, 2007
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