[IEEE 1995 IEEE MTT-S International Microwave Symposium -...

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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

Verspecht, J., Debie, P., Barel, A., Martens, L.
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Year:
1995
Language:
english
DOI:
10.1109/MWSYM.1995.406147
File:
PDF, 374 KB
english, 1995
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