[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - A bias dependent body resistance model for deep submicron PDSOI technology
Bu, Jianhui, Bi, Jinshun, Liu, Mengxin, Haogang Cai,, Han, ZhengshengYear:
2010
Language:
english
DOI:
10.1109/ICSICT.2010.5667708
File:
PDF, 428 KB
english, 2010