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[IEEE 2010 International Workshop on Junction Technology (IWJT) - Shanghai, China (2010.05.10-2010.05.11)] 2010 International Workshop on Junction Technology Extended Abstracts - Improved radiation response of PDSOI LBBC BUSFET
Bi, Jin-Shun, Hai, Chao-He, Han, Zheng-ShengYear:
2010
Language:
english
DOI:
10.1109/IWJT.2010.5474907
File:
PDF, 517 KB
english, 2010