Stress mapping on the porous silicon microcapsules by Raman...

Microelectronic Engineering 2012 / 10 Vol. 98

Stress mapping on the porous silicon microcapsules by Raman microscopy

Naumenko, D., Snitka, V., Duch, M., Torras, N., Esteve, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
98
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2012.07.089
Date:
October, 2012
File:
PDF, 706 KB
english, 2012
Conversion to is in progress
Conversion to is failed