[IEEE Design, Automation and Test in Europe - Munich,...

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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Designer-Driven Topology Optimization for Pipelined Analog to Digital Converters

Yu-Tsun Chien,, Dong Chen,, Jea-Hong Lou,, Gin-Kou Ma,, Rutenbar, R.A., Mukherjee, T.
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Year:
2005
Language:
english
DOI:
10.1109/DATE.2005.119
File:
PDF, 100 KB
english, 2005
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