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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - HBIST: An approach towards zero external test cost
Bubna, Mayur, Roy, Kaushik, Goel, AshishYear:
2012
Language:
english
DOI:
10.1109/VTS.2012.6231073
File:
PDF, 1.25 MB
english, 2012