[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and non-BIT) Systems in a Operational U.S. Navy Fighter/Attack Squadron
Woell, J.J.Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/IMTC.2005.1604490
File:
PDF, 90 KB
english, 2005