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SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications - Characterization study of native oxides on GaAs(100) surface by XPS
Feng, Liu, Zhang, Lian-dong, Liu, Hui, Gao, Xiang, Miao, Zhuang, Cheng, Hong-chang, Wang, Long, Niu, Sen, Chang, Benkang, Guo, HuiVolume:
8912
Year:
2013
Language:
english
DOI:
10.1117/12.2033679
File:
PDF, 304 KB
english, 2013