High-resolution Schottky CdTe diode detector
Takahashi, T., Mitani, T., Kobayashi, Y., Kouda, M., Sato, G., Watanabe, S., Nakazawa, K., Okada, Y., Funaki, M., Ohno, R., Mori, K.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2002.1039655
Date:
June, 2002
File:
PDF, 287 KB
english, 2002