[IEEE 2011 Future of Instrumentation International Workshop (FIIW) - Oak Ridge, TN, USA (2011.11.7-2011.11.8)] 2011 Future of Instrumentation International Workshop (FIIW) Proceedings - Managing and analyzing large data sets
Snyder, Derrick, Burress, BrianYear:
2011
Language:
english
DOI:
10.1109/FIIW.2011.6476827
File:
PDF, 855 KB
english, 2011