Scanning Probe Microscopy || Kelvin Probe Force Microscopy...

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Scanning Probe Microscopy || Kelvin Probe Force Microscopy of Semiconductors

Kalinin, Sergei, Gruverman, Alexei
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Volume:
10.1007/97
Year:
2007
Language:
english
DOI:
10.1007/978-0-387-28668-6_25
File:
PDF, 1.14 MB
english, 2007
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