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SPIE Proceedings [SPIE ICO20:Optical Devices and Instruments - Changchun, China (Sunday 21 August 2005)] ICO20: Optical Devices and Instruments - A method of measurement of polarized light ellipticity only
Asselborn, S. A., Kundikova, N. D., Novikov, I. V., Wyant, James C., Zhang, XuejunVolume:
6024
Year:
2005
Language:
english
DOI:
10.1117/12.666817
File:
PDF, 361 KB
english, 2005