Low-temperature electrical characterization of the...

Physica Scripta 2013 / 08 Vol. 88; Iss. 2

Low-temperature electrical characterization of the Ti–Si(100) interface at the p-Si/SiGe/Si–Ti structure using Hall measurement analysis

Arashti, Maryam Gholizadeh, Sadeghzadeh, Mohammad Ali
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Volume:
88
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/88/02/025701
Date:
August, 2013
File:
PDF, 404 KB
english, 2013
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