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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Semiconductor Lasers and Laser Dynamics V - Near-field characteristics of broad area diode lasers during catastrophic optical damage failure
Hempel, Martin, Tomm, Jens W., Baeumler, Martina, Konstanzer, Helmer, Mukherjee, Jayanta, Elsaesser, Thomas, Panajotov, Krassimir, Sciamanna, Marc, Valle, Angel, Michalzik, RainerVolume:
8432
Year:
2012
Language:
english
DOI:
10.1117/12.922395
File:
PDF, 8.60 MB
english, 2012