Carrier-diffusion measurements in silicon with a...

Physical Review B 1994 / 12 Vol. 50; Iss. 23

Carrier-diffusion measurements in silicon with a Fourier-transient-grating method

Linnros, Jan, Grivickas, Vytautas
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Volume:
50
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.50.16943
Date:
December, 1994
File:
PDF, 1.12 MB
english, 1994
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