Investigation of deep levels in high-resistivity bulk materials by photo-induced current transient spectroscopy. II. Evaluation of various signal processing methods
Balland, J C, Zielinger, J P, Tapiero, M, Gross, J G, Noguet, CVolume:
19
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/19/1/012
Date:
January, 1986
File:
PDF, 822 KB
english, 1986