Observation of Normally Distributed Energies for Interface...

IEEE Electron Device Letters 2013 / 08 Vol. 34; Iss. 8

Observation of Normally Distributed Energies for Interface Trap Recovery After Hot-Carrier Degradation

Pobegen, Gregor, Tyaginov, Stanislav, Nelhiebel, Michael, Grasser, Tibor
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2013.2262521
Date:
August, 2013
File:
PDF, 367 KB
english, 2013
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