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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Sampling ratio bridge for impedance measurements down to 1 mΩ
van den Brom, Helko E., Dierikx, Erik F., Jo, LeendertYear:
2012
Language:
english
DOI:
10.1109/CPEM.2012.6251066
File:
PDF, 151 KB
english, 2012