[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs
Manhas, S.K., de Souza, M.M., Gates, A.S., Chetlur, S.C., Sankara Narayanan, E.M.Year:
2000
Language:
english
DOI:
10.1109/RELPHY.2000.843899
File:
PDF, 355 KB
english, 2000