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Proposal of a universal test scene for depth map evaluation
Andorko, Istvan, Corcoran, Peter, Bigioi, AndVolume:
59
Language:
english
Journal:
IEEE Transactions on Consumer Electronics
DOI:
10.1109/TCE.2013.6531121
Date:
May, 2013
File:
PDF, 632 KB
english, 2013