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[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Mismatch characterization of small size MOS transistors
Bastos, J., Steyaert, M., Roovers, R., Kinget, P., Sansen, W., Graindourze, B., Pergoot, A., Janssens, E.Year:
1995
Language:
english
DOI:
10.1109/ICMTS.1995.513986
File:
PDF, 677 KB
english, 1995