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Band line-up determination at p- and n-type Al/4H-SiC Schottky interfaces using photoemission spectroscopy
Kohlscheen, J., Emirov, Y. N., Beerbom, M. M., Wolan, J. T., Saddow, S. E., Chung, G., MacMillan, M. F., Schlaf, R.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1599050
File:
PDF, 463 KB
english, 2003