Survey of sampling techniques for solids suitable for microanalysis by total-reflection X-ray fluorescence spectrometry
Klockenk�mper, Reinhold, von Bohlen, AlexVolume:
14
Year:
1999
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/A807693F
File:
PDF, 217 KB
english, 1999