Electron mobility behavior in extremely thin SOI MOSFET's

IEEE Electron Device Letters 1995 / 11 Vol. 16; Iss. 11

Electron mobility behavior in extremely thin SOI MOSFET's

Jin-Hyeok Choi,, Young-June Park,, Hong-Shick Min
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.468289
Date:
November, 1995
File:
PDF, 274 KB
english, 1995
Conversion to is in progress
Conversion to is failed