Ultra-high aspect ratio replaceable AFM tips using...

Nanotechnology 2013 / 11 Vol. 24; Iss. 46

Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam milling

Savenko, Alexey, Yildiz, Izzet, Petersen, Dirch Hjorth, Bøggild, Peter, Bartenwerfer, Malte, Krohs, Florian, Oliva, Maria, Harzendorf, Torsten
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
24
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/24/46/465701
Date:
November, 2013
File:
PDF, 913 KB
english, 2013
Conversion to is in progress
Conversion to is failed