Channel Hot Carrier Stress on Irradiated 130-nm NMOSFETs

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Channel Hot Carrier Stress on Irradiated 130-nm NMOSFETs

Silvestri, Marco, Gerardin, Simone, Paccagnella, Alessandro, Faccio, Federico, Gonella, Laura
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2000771
Date:
August, 2008
File:
PDF, 635 KB
english, 2008
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