[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - The side effects on N-Type FinFET Devices
Yang, Hsin-Chia, Du, Chong-Kuan, Liao, Wen-Shiang, Jhang, Jing-Zong, Lee, Yi-Hong, Chen, Tsao-Yeh, Liao, Ko-Fan, Wang, Mu-Chun, Chi, Sungching, Wang, Shea-JueYear:
2013
Language:
english
DOI:
10.1109/INEC.2013.6466084
File:
PDF, 427 KB
english, 2013