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[IEEE 2008 72nd ARFTG Microwave Measurement Symposium - Portland, OR, USA (2008.12.9-2008.12.12)] 2008 72nd ARFTG Microwave Measurement Symposium - A general closed-form solution to multi-port scattering parameter calculations
Wittwer, Peter, Pupalaikis, Peter J.Year:
2008
Language:
english
DOI:
10.1109/ARFTG.2008.4804295
File:
PDF, 940 KB
english, 2008