[IEEE ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - Santa Barbara, CA, USA (May 23-26, 2005)] Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - A study of correlation between traps and reverse-recovery characteristics of FWDs
Takahide Sugiyama, Shinya YamazakiYear:
2005
Language:
english
DOI:
10.1109/ISPSD.2005.1487996
File:
PDF, 449 KB
english, 2005