![](/img/cover-not-exists.png)
An imaging spectrometer based on high resolution microscopy of fluorescent aluminum oxide crystal detectors
Bartz, J.A., Zeissler, C.J., Fomenko, V.V., Akselrod, M.S.Volume:
56
Language:
english
Journal:
Radiation Measurements
DOI:
10.1016/j.radmeas.2013.01.041
Date:
September, 2013
File:
PDF, 467 KB
english, 2013