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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Terahertz Physics, Devices, and Systems VII: Advanced Applications in Industry and Defense - Micromachined probes for characterization of submillimeter-wave on-wafer components
Weikle, R. M., Anwar, Mehdi F., Crowe, Thomas W., Barker, N. S., Lichtenberger, A. W., Manzur, Tariq, Bauwens, M. F.Volume:
8716
Year:
2013
Language:
english
DOI:
10.1117/12.2019784
File:
PDF, 356 KB
english, 2013