SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Holographic Interferometry based on photorefractive crystal to measure 3D thermo-elastic distortion of composite structures and comparison with finite element models

Thizy, C., Lehmann, Peter H., Osten, Wolfgang, Eliot, F., Ballhause, D., Albertazzi, Armando, Olympio, K. R., Kluge, R., Shannon, A., Laduree, G., Logut, D., Georges, M. P.
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Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020542
File:
PDF, 3.28 MB
english, 2013
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