[IEEE 58th DRC. Device Research Conference - Denver, CO, USA (19-21 June 2000)] 58th DRC. Device Research Conference. Conference Digest (Cat. No.00TH8526) - Modeling high k gate current from p-type Si inversion layers
Fan, Y.-Y., Mudanai, S., Qi, W., Lee, J.C., Tasch, A.F., Register, L.F., Banerjee, S.K.Year:
2000
Language:
english
DOI:
10.1109/DRC.2000.877090
File:
PDF, 180 KB
english, 2000