In situ X-ray diffraction monitoring of GaInN/GaN...

Journal of Crystal Growth 2014 / 05 Vol. 393

In situ X-ray diffraction monitoring of GaInN/GaN superlattice during organometalic vapor phase epitaxy growth

Yamamoto, Taiji, Iida, Daisuke, Kondo, Yasunari, Sowa, Mihoko, Umeda, Shinya, Iwaya, Motoaki, Takeuchi, Tetsuya, Kamiyama, Satoshi, Akasaki, Isamu
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Volume:
393
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2013.11.072
Date:
May, 2014
File:
PDF, 3.48 MB
english, 2014
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