high-temperature ferroelectrics: Defect structure and...

Physical Review B 2011 / 8 Vol. 84; Iss. 6

high-temperature ferroelectrics: Defect structure and mechanism of enhanced electric resistivity

Drahus, Michael D., Jakes, Peter, Erdem, Emre, Schaab, Silke, Chen, Jun, Ozerov, Mykhaylo, Zvyagin, Sergei, Eichel, Rüdiger-A.
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Volume:
84
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.84.064113
Date:
August, 2011
File:
PDF, 505 KB
english, 2011
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