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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Sensing and Detection - Optical tomography based on phase-shifting schlieren deflectometry
Foumouo, Emmanuel, Berghmans, Francis, Mignani, Anna G., Dewandel, Jean-Luc, Joannes, Luc, van Hoof, Chris A., Beghuin, Didier, Jacques, Laurent, Antoine, PhilippeVolume:
7726
Year:
2010
Language:
english
DOI:
10.1117/12.854063
File:
PDF, 2.36 MB
english, 2010