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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Next-Generation Spectroscopic Technologies VI - A microfabricated, low dark current a-Se detector for measurement of microplasma optical emission in the UV for possible use on-site
Abbaszadeh, Shiva, Karim, Karim S., Karanassios, Vassili, Druy, Mark A., Crocombe, Richard A.Volume:
8726
Year:
2013
Language:
english
DOI:
10.1117/12.2016229
File:
PDF, 691 KB
english, 2013