![](/img/cover-not-exists.png)
XRF for Film Thickness Measurement: Pros. vs. Cons of Common Configurations
Reilly, FrancisVolume:
105
Language:
english
Journal:
Metal Finishing
DOI:
10.1016/S0026-0576(07)80364-3
Date:
January, 2007
File:
PDF, 300 KB
english, 2007