SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Integrating independent research into science curricula to foster STEM leadership
Queenan, Craig, Calabro, Alyssa, Becker, David, Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K.Volume:
8729
Year:
2013
Language:
english
DOI:
10.1117/12.2015991
File:
PDF, 206 KB
english, 2013