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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Bringing students to the mountain: developing partnerships to introduce students to cutting-edge research

Gillian-Daniel, Anne Lynn, Gordon, Robert J., Taylor, Benjamin L., McCarthy, Jon J., Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K.
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Volume:
8729
Year:
2013
Language:
english
DOI:
10.1117/12.2018232
File:
PDF, 2.61 MB
english, 2013
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